Accommodating Error Analysis in Comparison and Clustering of Molecular Fingerprints
Hugh Salamon*, Mark R. Segal*, Alfredo Ponce de Leon†, and Peter M. Small‡
Author affiliations: *University of California, San Francisco, California, USA; †Instituto Nacional Nutrición, Zubriran, Mexico City, Mexico; ‡Stanford University Medical Center, Stanford, California, USA
Figure 1. The align-and-count method finds the maximum number of mutually closest bands within a threshold deviation value ∆, for a search across a range S of scaling values. The two lanes are scaled incrementally, thus searching for the best alignment.
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